DATASHEET BSIMPROPLUS BSIMProPlus is the most efficient and accurate SPICE model extraction tool on the market for digital, analog, mix-signal, and RF modeling application — especially in advanced process technologies. It provides a new SPICE modeling framework built on BSIMPro and offers an active and passive device modeling solution for process technologies such as CMOS, RFCMOS, BiCMOS, bipolar junction transistor (BJT), silicon-on-insulator (SOI), SiGe, and TFT. I-V meter instrument RF modeling for active and passive device C-V meter instrument SPICE interface Spectre/HSPICE/Eldo for verification Probe station BSIMProPlus Low frequency modeling analog/mixed-signal Network analyzer instrument Statistical modeling specification based corner model generation Reliability modeling for NBTI/HCI Figure 1: Turn-key solution for SPICE model generation BSIMProPlus is a turn-key solution for SPICE model generation that includes a fast built-in model extraction and optimization process. For flexibility, an open user interface allows fullycustomized extraction also lets users add to or change the extraction routine. BSIMProPlus can be used for model development, automated data acquisition, SPICE parameter extraction and optimization of DC, C-V, RF, reliability models, plus device characterization and SPICE model validation (see Figure 1). BENEFITS Generating and verifying SPICE models with great efficiency and accuracy for advance process technologies is a challenge to foundries, IDMs, and many design companies. BSIMProPlus offers the following advantages that enable more accurate designs and faster time-to-market. • Accurate and efficient data acquisition and automated measurement routine for DC, CV, S-parameter of n-ports, and stress data • Batch mode and interactive mode parameter extraction, local optimization, and global optimization • Auto-binning model generation and verification Figure 2: Model fitting to data for MOSFET I-V characteristics • Automated HCI/NBTI reliability model generation and device lifetime extraction • Specification-based corner model generation with and without electrical test data • Internal SPICE and external SPICE simulation for model verification • Flexible graph capabilities • RF modeling for active and passive devices • Auto error report generation and documentation with MS and html formats • Flexible solution for SPICE, NTBI, HCI, statistical model generation, and small circuit characterization FEATURES BSIMProPlus is used by most foundries and integrated device manufacturers (IDMs) that support BSIM3, BSIM4, HVMOS, Mextram, BSIMSOI, TFT, and other compact models. BSIMProPlus is the new generation SPICE-model parameter extraction software — based on the success of BSIMPro and ready for nanometer device technology. It supports both public domain and proprietary models for different process technologies including deep-submicron CMOS, SiGe, SOI, TFT, etc. Figure 3: BSIM4 model extraction and local optimization FLEXIBLE EXTRACTOR • Provides accurate and fast extraction routines for I-V, C-V, temperaturemodel, and RF small equivalent circuit model parameter extractions (see Figure 2) • Supports extraction for analog or mixed-signal applications • Extracts reliability-model parameters for hot-carrier injection (HCI) and negative bias temperature instability (NBTI) • Allows for local optimization during extraction • MDE module and macro capabilities allow customer-defined model implementation and extraction • Features physical extraction, local and global optimization (see Figure 3) • Yields the best accuracy and efficiency, in a turnkey solution • Enables customized extraction with a proprietary extraction routine 2 • Performs specification-based statistical modeling and corner-model generation VERSATILE OPTIMIZATION • Powerful and versatile optimization functions support both standard and customized optimization targets (see Figure 4) • Allows optimization of multiple characteristics, such as I-V and C-V, simultaneously • Supports the selection of multiple bias regions and different bias curves simultaneously • Enables the creation of customized optimization targets, such as Vt vs. L through macro • Allows users to assemble optimization procedures using Auto Optimization Setup AUTO BINNING Figure 4: Multi-window capability for global optimization BSIMProPlus supports bin-model extraction to improve data model fitting accuracy. If a geometry model is missing, it allows you to generate a pseudo device model automatically and guarantee continuity of models when crossing bins. The auto-binning feature allows user to get accurate binning model accurately. MEASUREMENT BSIMProPlus measures I-V and C-V characteristics for MOSFET, BJT, diode, and any user-defined device under test (DUT) (see Figure 5). BSIMProPlus control following equipment: Figure 5: C-V measurement data of Cgg vs. Vgs for MOSFET • I-V: – Keithley 4200 – Agilent 4142, 4145, 4155, 4156A/B/C, 4157/5270 • C-V: – Keithley 590 – Agilent 4285, 4294 • Switching matrix – Keithley 707/708 – Agilent 4085, 5250 • Probe station – Cascade: Summit 12000, S300, and PS21 – Suss Microtech: PA200, PA300 • System controller: PC compatible with National Instruments GPIB card Figure 6: Parameter distribution generated by calibrated monte carlo simulation for corner model generation 3 CORNER MODEL BSIMProPlus generates corner models based on process specifications, E-T data, or I-V data. Prediction of nominal, worst, and best case SPICE models is often necessary when there is little or no measured data, as is often the case for either technologies under development or advanced future technologies. The specificationbased corner model and typical model generation methodology allow user to overcome these difficulties (see Figure 6). Key steps include: • Auto searching for typical die • Auto retargeting for typical model generation • Calibrated Mote Carlo analysis based on process parameter specifications Figure 7: Percentage change of Idsat, Vth, and Gm vs. stress time • Corner model generation RELIABILITY MODEL BSIMProPlus extracts AgeMOS-model parameters, substrate current and lifetime parameters for HCI and NBTI reliability modeling (see Figure 7). The stressing and data collection for NBTI and HCI are automated through simultaneous control of various types of measurement hardware. • Provides real-time stress status; a timetable itemizes the status and progress of each device under stress Figure 8: Igate and Isub extraction and optimization for reliability model parameter and device lifetime • Monitors device degradation during stress through periodic measurement of MOSFET threshold voltage, transconductance, gate, and bulk current characteristics • Measures and saves I-V characteristics during stress and makes data files available for viewing • Wafer-level probing, stress, and measurement for wafer-level reliability (WLR) testing • Performs package-level testing by providing package-level stresses and measurement support • Supports the extraction of hot-carrier lifetime model parameters through extract model parameters • Accommodates two lifetime extraction models — substrate-current and gate-current models (see Figure 8) Figure 9: Simulated vs. measured data for AgeMOS, a reliability model 4 • Enables links to circuit reliability and full-chip reliability simulators • Reaches ultra-fine resolution through WLR testing • Generate aged hot-carrier degradation models • Generate AgeMOS model for NBTI and HCI (Figure 9) RF-DEVICE MODELING RF modeling capability of BSIMProPlus allows RF device engineers to meet the needs of bipolar and RF CMOS designers for SPICE simulation and circuit design. There are many built-in macro models for user to choose including active to passive devices such as BSIM3v3 for MOSFET, 1-pi or 2-pi model for spiral inductor, etc. BSIMProPlus RF will take you through measurement, system calibration, and de-embedding features to ensure the most accurate measurement data. You can then extract small signal model equivalent circuit model parameters or optimize extrinsic macro parameters as well as intrinsic model parameters for MOSFET, BJT, and passive devices parameters. • System calibration: Calibration is extremely important for RF measurement to data accuracy. BSIMProPlus offers a number of ways to subtract parasitics coming from measurement environment and supports standard and user-specified test kits to calibrate your system • RF de-embedding: Designers must assure measurement accuracy by deembedding pad parasitics using dummy test structures. BSIMProPlus can measure these dummy test structures and save the data for automatic de-embedding calculations. Measured S-parameters can then be converted to Y or Z parameters for parallel and serial de-embedding procedures • Optimization: Optimizes extrinsic as well as intrinsic model parameters for MOSFET, BJT, and passive devices • Model support: Provides complete support for BSIM3v3, BSIM4, BJT, and other standard models Figure 10: Gummel-Poon (upper) vs. Mextram model (lower) RF MODELING FLEXIBILITY • BSIMProPlus ensures maximum flexibility in order to obtain the most accurate RF model possible • Easy-to-use interface that allows you to specify your own RF macro models with an arbitrary number of parasitic parameters • Supports external simulators such as HSPICE and Spectre® or internal simulation engines for increased simulation speed • List simulated and measured data simultaneously for any frequency and bias combination and display for RMS error between simulated and measured data • RF measurement equipment control: VNA (Vector Network Analyzer) – Anritsu 37000 – Agilent 8753, 8722, 8720, 8510 PNA – Agilent 8358, 8357 I-V – Keithley 4200 – Agilent 4142, 4145, 4155, 4156A/B Probe station ACCURATE BJT MODELS Designers can accurately and easily extract parasitics such as Rb, Re, or Rc from RF data using a unique pointand-click feature (see Figure 10). After de-embedding, BSIMProPlus automatically performs high frequency parameter (Ft) calculations via the selected region of S-parameters. Easy-to-follow drag-and-drop menus give you the option to choose areas of your design to focus on to obtain results quickly and accurately. ONE MODEL FROM DC TO RF FREQUENCIES FOR CMOS TECHNOLOGIES With BSIMProPlus, you can generate one accurate model that is applicable from DC to RF frequencies and simultaneously optimize DC and RF model for BSIM3v3 and BSIM4 (see Figure 11). For example, you can fit transconductance (Gm), output resistance (Rout), and S-parameters at the same time by optimizing both intrinsic BSIM3v3 model and extrinsic parasitic parameters. You can view the results of optimization on both DC and RF characteristics in real-time during the optimization. – Cascade: Summit 12000, S300, PS21 – Suss Microtech: PA200, PA300 System controller: PC compatible with National Instruments GPIB card 5 Figure 11: Model fitting to data for MOSFET S-parameter characteristics Figure 12: 2-pi model for spiral inductor modeling PASSIVE DEVICE MODELING • Stacked spiral inductor With built-in extraction routines for spiral inductor modeling, you can use BSIMProPlus to generate accurate 2-π small signal equivalent circuit models from measured S-parameter data (see Figure 12). The calibrated built-in 3-D EM solver allows user to generate S-parameter for model extraction and optimization featuring: • Balun spiral inductor 6 • Tapered spiral inductor • Paired spiral inductor • Stacked and Balun transformer • Integrated capacitor • Four different pattern ground shielding options and two types of ground options Figure 13: RPI TFT model parameter extraction and simulation Figure 14: SOI model with self-heating on (left) vs. self-heating off (right) MODEL SUPPORT Extraction, simulation, and optimization are supported for all major MOSFET models such as BSIM4, BSIM3v3 (all versions), EKV, BSIMPD (for partially depleted SOI), HVMOS (for high-voltage MOSFET), AgeMOS (for HCI and NBTI reliability); BJT models such as Gummel-Poon, Mextram; diode and other device types (see Figures 13 and 14). No matter what your extraction need is, BSIMProPlus has the answer for you through user-friendly open user interface. For extraction, simulation, and optimization: • BSIM3v3 For Simulation and optimization: • HiCUM • MOS 9 and MOS 11 • BSIM4 • Mextram • Gummel-Poon • EKV • Diode • HVMOS • AgeMOS • BSIMPD • BSIMSOI3.0 • BTASOI • RPI a-Si TFT • RPI p-Si TFT 7 Figure 15: 3-D graphic capability for model parameter verification VERIFICATION AND DOCUMENTATION BSIMProPlus allows user to verify the integrity and continuity of all loaded models by simulating device characteristics of a wide range of geometries, operating points, and effective parameters and viewing them in 2-D and 3-D plots to help capture all potential problems before you release the model (see Figure 15). BSIMProPlus can also generate the error report quickly. The internal 3-D viewer and external network interface to SPICE simulation allow user to verify model’s robustness, smoothness, and consistency. The MS Word and html formats are available for generating error report and documentation very efficiently. PLATFORMS (for English and Chinese OS) • Windows NT with SP5 or later • Windows 2000 • Windows XP Professional • Window 95B • Windows 98 second version © 2003 Cadence Design Systems, Inc. All rights reserved. Cadence and the Cadence logo are registered trademarks of Cadence Design Systems, Inc. All others are properties of their respective holders. 4575 05/03
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