1. Ingeniería

NIDays
Agenda
24. März 2015
08:15 – 09:00
Registrierung
09:00 – 10:15
Keynote: You and NI – gemeinsam das Internet der Dinge gestalten
10:15 – 10:45
Kaffeepause / Besuch der Ausstellung
Software Development
10:45 – 11:30
Smart device for remote Experimentation
Christophe Salzmann Laboratoire
d‘automatique - EPFL
11:30 – 12:15
Embedded Control & Monitoring
Measurement
Don’t Think You Need an FPGA? Think
Again!
5 Red Flags to Consider Before Choosing
Configuration-based DAQ Software
Vincenzo Maira, National Instruments
Andreas Scheuber, National Instruments
RF & Big Data
Broadband array receivers for
MRI with optical transmission
from the magnet
Test, Validation & Verification
Automated testing of Schindler
converters through VeriStand
Do Engineering: Graduating
Innovation Ready Students
Elio Lüthi, Noser Engineering AG
Dave Wilson, Beat Schib, National
Instruments
Solar Water Pump Controller
Optimization using JMAG FEA
and NI Electric Motor Simulation
Toolkit
LabVIEW User Interface for the
Control of a Siemens PLC using
TCP/IP
David Brunner, ETH Zürich
Flexible and user-friendly GUI with
LV OOP
New Enterprise Solution for Condition
Monitoring Applications
Temperature regulated Water Circiut for Heat
stressed Component-testing
Advances in RF and Microwave
Technologies
Felix Aeschimann, MEquadrat AG
Rupert Donauer, National Instruments
Nicolas Krauer, Krauer Engineering
Christian Gindorf, National
Instruments
Research & Academic
Workshops* & Seminars
Workshop: Industrial Image
Processing with the Vision
Builder for Automated Inspection
(VBAI)
Jean Mallo, National Instruments
Jérôme Blum, FHNW
Prof. Andrea Vezzini, Berner
Fachhochschule
12:15
–
13:00
Creating Highly Innovative User
Interfaces with LabVIEW
Online optimization of ongoing control
processes (software-in-the-loop)
DAQ Advanced: Synchronizing Systems
Beyond a Single Chassis
Lorenz Casper, National Instruments
Daniel Roth, PI Electronics AG
Julien de Freitas, National Instruments
12:15 – 13:30
Mittagspause / Besuch der Ausstellung
13:30 – 14:15
Keynote: You and NI – gemeinsam grosse technische Herausforderungen bewältigen
14:15 – 14:30
Raumwechsel
14:30 – 15:15
Introduction to the LabVIEW Object- oriented
Programming and Hardware Abstraction Layers
LabVIEW on networked embedded
hardware
Joseph Tagg, National Instruments
Marco Schmid, Schmid Elektronik AG
15:15 – 15:45
Kaffeepause / Besuch der Ausstellung
15:45 – 16:30
Tips for Code Re-use – Bringing Your
.dll, .m, and .mdl Files into the LabVIEW
Fold
Simplify System Complexity with the
New High-Performance CompactRIO
Controller
Jean Mallo, National Instruments
Vincenzo Maira, National Instruments
Database-driven LabVIEW framework
Scalable LabVIEW Applications Through
Object-Oriented Programming (OOP)
16:30 – 17:15
Beat Liesch, RhB
Olivier Jourdan, QMT Group
Prototyping Next-Generation
5G Wireless Communication
Systems
Production and development
test device series with TestStand
Custom Sequence Editor
Christian Gindorf, National
Instruments
Matthias Kubli, Helbling Technik AG
Introduction to NI VirtualBench
Big Analog Data
Stefan Albert, National Instruments
Andrea Perin, National Instruments
Are Modular Instruments Right
for Me?
Vincenzo Maira, National
Instruments
Bruker Site Planning Suite
LabVIEW & SQLite
Matthias Weller, Bruker BioSpin AG
Otto Gansner, PI Electronics AG
Measuring force, pressure, and
acceleration with piezoelectric sensors
and LabVIEW
Martin Stierli, Kistler Instrumente AG
17:15 – 18:30
Wind energy without drawbacks
Andreas Demmer, ABB Schweiz AG,
Fabian Hämmerli, Paul Scherrer
Institut
CompactRIO Real-Time Control
for Hydraulic Turbomachinery
Model Testing
Introduction to NI Motion
Julien de Freitas, National
Instruments
Dr. Vlad Hasmatuchi, HES-SO Valais
Scalable test system: combine
LabVIEW and TestStand
Workshop*: Embedded Systems
for Research & Academic
Workshop: Build your Own
Embedded System
Claude Mengisen, Christoph Märki, Paul
Wermelinger, Zühlke Engineering AG
Jan Wagner, National Instruments
Andreas Scheuber, National
Instruments
Best Practices for Saving
Measurement Data
New Software Designed
Instruments
Corinne Doppmann, National
Instruments
Rupert Donauer, National
Instruments
Apéro / Besuch der Ausstellung
* Bitte beachten Sie, dass die Plätze für die Workshops
begrenzt sind und für die Teilnahme eine separate Anmeldung (siehe Anmeldeformular) erforderlich ist.